Hello Support,
In the Aurix 2G Safety Manual, there is a section "ESM[SW]:MCU:LBIST_RESULT" where the following is mentioned:
"Therefore it might happen that under extreme operation conditions a
single LBIST run might fail by showing an unexpected MISR-result."
For SAK-TC3xx device, when the ambient is 125C and Voltage rails are within Spec, is there a possibility LBIST MISR value will be wrong?
Please help me better understand this statement.
Best Regards
In the Aurix 2G Safety Manual, there is a section "ESM[SW]:MCU:LBIST_RESULT" where the following is mentioned:
"Therefore it might happen that under extreme operation conditions a
single LBIST run might fail by showing an unexpected MISR-result."
For SAK-TC3xx device, when the ambient is 125C and Voltage rails are within Spec, is there a possibility LBIST MISR value will be wrong?
Please help me better understand this statement.
Best Regards